[Registered Patent] On-Device AI-Based Real-Time Manufacturing Defect Detection
Republic of Korea Patent
- Participated as a researcher during the early founding stages of Plaid Labs. conducting research on on-device AI-based real-time manufacturing defect detection techniques and securing a patent.
- Advanced the GLASS anomaly detection framework to implement and enable real-time anomaly detection on NPUs (Neural Processing Units).
- Patent Number: Republic of Korea Patent No. 10-2025-0152524



